References
ACDI. (Photographer) (2011). ICT without expensive fixtures [Web]. Retrieved from http://www.acdi.com/latest-news/ict-without-expensive-fixtures-acdi-expands-capabilities-with-in-house-flying-probe-tester/
Barnes, E., Dai, J., Deng, S., Down, D., Goh, M., Lau, H. C., & Sharafali, M. (2000). Electronics manufacturing service industry. The Logistics Institute–Asia Pacific, Georgia Tech and The National University of Singapore, Singapore.
Bowling, S. R., Khasawneh, M. T., Kaewkuekool, S., & Cho, B. R. (2004). A Markovian approach to determining optimum process target levels for a multi-stage serial production system. European Journal of Operational Research, 159, 636-650.
Buttars, S. P. (1993). Parameters for solder paste printing for fine pitch components. Proceedings- NEPCON West '93, Anaheim, California, 3, 1254-1265.
Direct Industry. (Photographer) (2014). SMT pick & place machine [Web]. Retrieved from http://www.directindustry.com/prod/europlacer/smt-pick-place-machines-55695-363829.html
Finkelshtein, A., Herer, Y. T., Raz, T., & Ben-Gal, I. (2005). Economic optimization of off-line inspection in a process subject to failure and recovery. IIE Transactions, 37(11), 995-1009.
Heredia-Langner, A., & Montgomery, W. M. (2010). Solving a multistage partial inspection problem using genetic algorithms. International Journal of Production Research, 40(8), 1923-1940.
Huang, J. C. Y. (2010). Reducing solder paste inspection in surface-mount assembly through Mahalanobis–Taguchi analysis. Electronics Packaging Manufacturing, IEEE Transactions, 33(4), Retrieved from http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=5559398&url=http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5559398
Hwang, J. S. (2004). Solder technologies for electronic packaging and assembly. In C. Harper & R. M. Sampson (Eds.), Electronic Materials and Processes Handbook.
IPTE. (Photographer) (2014). Bare board loader (BBL)[Web]. Retrieved from http://www.ipte.com/systems/conveying/loaders-unloaders/bbl/
Kakade, V., Valenzuela, J. F., & Smith, J. S. (2004). An optimization model for selective inspection in serial manufacturing systems. International Journal of Production Research, 42(18), 3891-3909.
Lee, J., & Unnikrishnan, S. (1998). Planning quality inspection operations in multistage manufacturing systems with inspection errors. International Journal of Production Research, 36(1), 141-156.
Li, M. C., Al-Refaie, A., & Yang, C. (2008). DMAIC approach to improve the capability of SMT solder printing process. IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, 31(2), 126-133.
Linkwitz, S. (Photographer) (2014). Woofer - analog signal processor [Web]. Retrieved from http://www.linkwitzlab.com/Pluto/woofer-asp.htm
Penn, M., & Raviv, T. (2008). A polynomial time algorithm for solving a quality control station configuration problem. Discrete Applied Mathematics, 156, 412-419.
Raz, T., Herer, Y. T., & Grosfeld-Nir, A. (2007). Economic optimization of off-line inspection. IIE Transactions, 32(3).
Recon Sales Group (Videographer) (2013). Nutek vacuum style bare board loader [Theater]. Available from http://www.youtube.com/watch?v=kBqYx1JPFGo
Sadegheih, A. (2007). Sequence optimization and design of allocation using GA and SA. Applied Mathematics and Computation, 186, 1723-1730.
Sankarasubbu, K. G. (2011). Design of an information system for quality assurance at an EMS provider: A case study. (Master's thesis, Binghamton University State University of New York).
Shea, C. (2012, May 7). Troubleshooting the stencil printing process. Retrieved from www.smta.org/../Houston_Troubleshooting_The_Stencil_Printing_Process _-_Chrys_Shea.pdf
Shetwan, A. G., Vitanov, V. I., & Tjahjono, B. (2011). Allocation of quality control stations in multistage manufacturing systems. Computers & Industrial Engineering, 60, 473-484.
Shiau, Y. (2002). Inspection resource assignment. International Journal of Production Research, 40(8), 1787-1806.
Syrus, T., & Pecht, M. G. (2001). Manufacturer assessment procedure and criteria for parts selection and management. IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, 24(4), 351-358. Retrieved from http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=980045
Tummala, R. (2004). Fundamentals of microsystems packaging.
Van Volsem, S., Dullaert, W., & Van Landeghem, H. (2007). An evolutionary algorithm and discrete event simulation for optimizing inspection strategies for multi-stage processes. European Journal of Operational Research, 179, 621-633.